JU, Chengru; TRINH, Toan Khang. A Machine Learning Approach to Supply Chain Vulnerability Early Warning System: Evidence from U.S. Semiconductor Industry. Journal of Advanced Computing Systems , [S. l.], v. 3, n. 11, p. 21–35, 2023. DOI: 10.69987/JACS.2023.31103. Disponível em: https://scipublication.com/index.php/JACS/article/view/77.. Acesso em: 4 jul. 2025.